N80 High Resolution Micro CT
N80 Micro CTwith highest resolution imaging, long life and maintenance free, low cost of ownership, suitable for a variety of installation environments, integrated software
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  • Why choose N80 high-resolution Micro CT?
  • Product Specification
  • Product Application
  • Product Software
  • Product Accessories
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High Resolution Micro CT
High resolution desktop micro CT
High-precision imaging and maintenance-free equipment

The N80 desktop high-resolution micro CT adopts the closed-tube transmission ray source design, combining the advantages of traditional open-tube transmission and closed-tube reflection. High-resolution imaging, maintenance-free equipment, wide range of applications, integrated software design, can be equipped with temperature-controlled sample stage and stretching stage for in situ testing.

Why choose N80 high-resolution micro CT?
Why choose N80 high-resolution Micro CT?
  • High resolution imaging
    Excellent image quality
  • All-purpose instrument
    Wide range of applications
  • High compatibility
    Large sample size
  • Closed tube radiation source design
    Long life and maintenance free

    采用独家的闭管透射式 X 射线源,使用寿命长,免维护,使用成本低

  • All-in-one software
    Free upgrades
High resolution imaging
Excellent image quality
All-purpose instrument
Wide range of applications
High compatibility
Large sample size
Closed tube radiation source design
Long life and maintenance free

采用独家的闭管透射式 X 射线源,使用寿命长,免维护,使用成本低

All-in-one software
Free upgrades
Product Specification
Product Specification

 

Overall indicators
Pixel resolution 0.4 µm / 1.2 µm
Spatial resolution 2 µm
Maximum scanning diameter 100 mm
Maximum scanning height 137 / 163 mm
Sample height 200 mm
Equipment size 1200 x 640 x 520 (mm)
Equipment weight 225 kg

 

X-ray source  
Maximum voltage 110 kV
Maximum power 16 W
Focus size 2 µm
Number of filters 20

 

 

Equipment detectors  
Image detector

16 MP CCD

7 MP FP

Radiological defense Anti-Radiation Damage Function

 

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Product application
Product Application
Scan at 760nm per pixel
Scan at 760nm per pixel

Carbon fiber reinforcement scanned at 760 nm per pixel in NEOSCAN N80 was used.

Scan at 860nm per pixel
Scan at 860nm per pixel

Glass fiber reinforced nylon material scanned at 860 nm per pixel in NEOSCAN N80 was used.

Scan at 980nm per pixel
Scan at 980nm per pixel

Using a beetle scanned at 980nm per pixel in the NEOSCAN N80 reveals its internal structure in great detail.

Product Software
Product Software

Process-oriented processing with intuitive interface;

The software integrates various functions such as scanning, reconstructing, calculating, and outputting models.

No need to switch between multiple software, convenient and easy to use;

The software is free of charge and supports remote diagnosis.

Product Accessories
Product Accessories
  • Temperature Controlled Sample Stands
  • Compression/Tension Test Bench
  • Autosampler
01
Temperature Controlled Sample Stands

The Temperature Controlled Sample Stage allows in-situ micro-CT measurements to be performed in temperature changing environments to study the effect of temperature on the three-dimensional microstructure of an object. The temperature-controlled sample stage can be cooled and heated from a 40°C drop in ambient temperature to a 120°C rise. The temperature range can be precisely controlled with an accuracy of less than 1°C by means of a 48MHz internal microprocessor.

02
Compression/Tension Test Bench

The compression/tension test rig allows mechanical tests to be performed in the field to study the effects of compression and tension on the three-dimensional microstructure of an object. Compression and tension can be performed in the same unit with an accuracy of 1% of the maximum power. The current maximum load is 1000N and other load cells will be added in the future.

03
Autosampler

The automatic sample unit enables automatic sample change. It is located outside the shielding area so that scanned samples can be removed and new samples loaded without interrupting the scanning cycle.

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