采用独家的闭管透射式 X 射线源,使用寿命长,免维护,使用成本低
Overall indicators | |
Pixel resolution | 0.4 µm / 1.2 µm |
Spatial resolution | 2 µm |
Maximum scanning diameter | 100 mm |
Maximum scanning height | 137 / 163 mm |
Sample height | 200 mm |
Equipment size | 1200 x 640 x 520 (mm) |
Equipment weight | 225 kg |
X-ray source | |
Maximum voltage | 110 kV |
Maximum power | 16 W |
Focus size | 2 µm |
Number of filters | 20 |
Equipment detectors | |
Image detector |
16 MP CCD 7 MP FP |
Radiological defense | Anti-Radiation Damage Function |
Process-oriented processing with intuitive interface;
The software integrates various functions such as scanning, reconstructing, calculating, and outputting models.
No need to switch between multiple software, convenient and easy to use;
The software is free of charge and supports remote diagnosis.
The Temperature Controlled Sample Stage allows in-situ micro-CT measurements to be performed in temperature changing environments to study the effect of temperature on the three-dimensional microstructure of an object. The temperature-controlled sample stage can be cooled and heated from a 40°C drop in ambient temperature to a 120°C rise. The temperature range can be precisely controlled with an accuracy of less than 1°C by means of a 48MHz internal microprocessor.
The compression/tension test rig allows mechanical tests to be performed in the field to study the effects of compression and tension on the three-dimensional microstructure of an object. Compression and tension can be performed in the same unit with an accuracy of 1% of the maximum power. The current maximum load is 1000N and other load cells will be added in the future.
The automatic sample unit enables automatic sample change. It is located outside the shielding area so that scanned samples can be removed and new samples loaded without interrupting the scanning cycle.
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